<?xml version="1.1" encoding="utf-8"?>
<article xsi:noNamespaceSchemaLocation="http://jats.nlm.nih.gov/publishing/1.1/xsd/JATS-journalpublishing1-mathml3.xsd" dtd-version="1.1" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance"><front><journal-meta><journal-id journal-id-type="publisher-id">EIR</journal-id><journal-title-group><journal-title>Educational Innovation Research</journal-title></journal-title-group><issn>3029-1844</issn><eissn>3029-1852</eissn><publisher><publisher-name>WHIOCE PUBLISHING PTE. LTD.</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.18063/EIR.v3i11.1708</article-id><article-categories><subj-group subj-group-type="heading"><subject>Article</subject></subj-group></article-categories><title>Research on Defect Identification and Detection of Electronic Components Based on Intelligent Algorithms and Its Applications</title><url>https://artdesignp.com/journal/EIR/3/11/10.18063/EIR.v3i11.1708</url><author>TangJun</author><pub-date pub-type="publication-year"><year>2025</year></pub-date><volume>3</volume><issue>11</issue><history><date date-type="pub"><published-time>2025-12-20</published-time></date></history><abstract>The rapid iteration of intelligent algorithms provides a core foundation for advancing electronic component defect detection technology, effectively addressing industry challenges such as low accuracy, poor efficiency, and limited adaptability associated with traditional detection methods. Focusing on electronic component defect identification and detection, this paper analyzes the fundamental principles of integrating intelligent algorithms with defect detection, identifies key optimization directions for industrial applications, explores algorithmic applications across various defect types, and outlines practical implementation pathways. The study aims to offer theoretical insights for establishing an efficient and precise intelligent defect detection system and promote the widespread adoption of intelligent algorithms in electronic manufacturing quality control.</abstract><keywords>Intelligent algorithms, Electronic components, Defect identification, Detection applications</keywords></article-meta></front><body/><back><ref-list><ref id="B1" content-type="article"><label>1</label><element-citation publication-type="journal"><p>[1] Zhang W, Xie S, Zhang Z, et al., 2025, A Study on Intelligent Detection Methods for Defects in Electronic Components. China Equipment Engineering, 2025(14): 195&amp;ndash;197.
[2] Wang L, Deng Z, 2025, Research on a Visual Defect Extraction Method for Electronic Components Based on Joint Bilateral Filtering of Images. Electronic Devices, 48(4): 847&amp;ndash;852.
[3] Mao L, 2025, Exploration of Intelligent Cultural and Creative Design Combining Paper Materials with Electronic Components. East China Paper Industry, 55(5): 78&amp;ndash;80.
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